SKY GROUP
This equipment is designed for inspecting and measuring defects that may occur at various stages of the manufacturing process for TSP, OLED, and LCD cell products. When unit-loaded cell products are placed on the tray and loaded into the equipment, the system automatically recognizes product information through MCR reading and conducts an inspection. The measurement data is then stored and transmitted to the upper server, and the system automatically unloads the inspected products. This is a fully automated inspection system.
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Product Features
- Superior defect differentiation capability with diverse imaging and algorithm implementation, ensuring high inspection accuracy
- Various false defect prevention solutions to minimize false detections
- Specially optimized lighting enables enhanced 2D imaging for high-precision inspection and high throughput
- Uses image comparison to ensure precise measurement and high-speed inspection
- Provides defect-related inspection results with unit mapping information of the tray when defects occur
- Stores measurement data and inspection results in 2D format
- Defect review function (defect images and inspection result data)
Inspection Items
Top Vision
- Cell Size
- Cell Max Size (Edge)
- Seal Width
- Crack
Side Vision
- Chipping
- Cell Depth
- Grinding Width
- Support Material
Product Specifications
| Panel Size | 2~12 inch Panel |
| Inspection Time | <15 sec |
| Inspection Items | Top Vision: - Cell Size - Cell Max Size (Edge) - Seal Width - Crack Side Vision: - Chipping - Cell Depth - Grinding Width - Support Material |
| Applicable Devices | TSP/OLED/LCD |
Product Features
- Superior defect differentiation capability with diverse imaging and algorithm implementation, ensuring high inspection accuracy
- Various false defect prevention solutions to minimize false detections
- Specially optimized lighting enables enhanced 2D imaging for high-precision inspection and high throughput
- Uses image comparison to ensure precise measurement and high-speed inspection
- Provides defect-related inspection results with unit mapping information of the tray when defects occur
- Stores measurement data and inspection results in 2D format
- Defect review function (defect images and inspection result data)
Inspection Items
Top Vision
- Cell Size
- Cell Max Size (Edge)
- Seal Width
- Crack
Side Vision
- Chipping
- Cell Depth
- Grinding Width
- Support Material
Product Specifications
| Panel Size | 2~12 inch Panel |
| Inspection Time | <15 sec |
| Inspection Items | Top Vision: - Cell Size - Cell Max Size (Edge) - Seal Width - Crack Side Vision: - Chipping - Cell Depth - Grinding Width - Support Material |
| Applicable Devices | TSP/OLED/LCD |